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A state of the art SEM with Schottky field emission (FE) cathode in combination with gallium Focused Ion Beam (FIB) column and Gas Injection System (GIS).

The SEM/FIB used is managed by the University of ��ʤ������'s (��ʤ������'s) University Instrumentation Center (UIC) and was purchased with funds awarded to ��ʤ������ from the US National Science Foundation (NSF) (; Todd Gross, Mechanical Engineering, ��ʤ������, PI) with additional funds from ��ʤ������. EDS/EBSD components on this system were purchased with start-up funds from ��ʤ������ at the discretion of Marko Knezevic (Mechanical Engineering, ��ʤ������).

Specifications:

• Combined SEM/FIB field emission microscope
• High brightness Schottky emitter for high-resolution/high current/low-noise imaging
• FIB column for site specific analysis, deposition of platinum, and ablation of materials
• Automatic FIB cutting and signal acquiring followed by 3D reconstruction with 3D visualization
• Standard Secondary Electron (SE), Back-Scatter Electron (BSE), and Cathodoluminescence (CL) detectors
• In-beam SE and BSE detectors
• Edax EDS and EBSD detectors for elemental analysis and examination of crystallographic orientation of materials
• Ga liquid metal ion source
• Magnification from 4X to 1,000,000X (at 1kV to 30kV)
• Tri monitor set up with additional 60” common display

Available Accessories:

• Gatan tensile/compression stage is available for performing dynamic material property studies with synchronized image and data acquisition. Maximum load is 2,000 Newtons

Principal scientist: Nancy Cherim

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W123 Parsons Hall
Durham, NH 03824
Phone: (603) 862-2182

��ʤ������ Rate: 
$80.00/hour  assisted
$33.00/hour  unassisted

Non ��ʤ������ academic Rate: 
$160.00/hour  assisted
$66.00/hour   unassisted

Industry Rate:
$250.00/hour assisted
$168.00/hour unassisted